Release Notes
WITE32
Version 3.11
6/28/2004
Copyright 2004 Guzik Technical Enterprises. All rights reserved
WITE32 Release Notes Version 3.11
CHAPTER 1
NEW HARDWARE SUPPORTED IN
WITE32
1.1
Support of Servo Revision 3 for RWA-2000 Series
WITE32 software version 3.11 supports the RWA-2000 series of testers equipped with Servo Revision 3. Please refer
to the Guzik Servo Revision 3 For RWA-2000 Series document P/N 02-107283-03 for more details on the new
features of Servo Revision 3.
From the operation and WITE32 user interface point of view, Servo Revision 3 is the same as Servo Revision 2.
Please refer to the WITE32 Servo User's Guide document P/N 02-106596-01 for more details on how to use Guzik
Servo.
Servo Revision 3 is not supported by previous versions of WITE32 software. You may get various error messages
related to servo misconfiguration if you run previous versions of WITE32 on the RWA equipped with Servo Revision
3, for example, "Spinstand Error. Incorrect parameter value. Only 3 burst gates servo mode is supported: 5 ".
Note:
In WITE32 version 3.11, an RWA-2000 series equipped with Servo Revision 3 is compatible with Guzik V2002 and Canon
spinstands only. The servo will not be available if you connect Servo-3 RWA to Servo-2 or Servo-1 Guzik 1701 or 312
spinstand.
1.2
1.3
Comb Loader for Guzik V2002 Spinstands
Starting from WITE32 version 3.11 the new head loading mechanism is supported for V2002 spinstand (Comb
Loader). Please refer to the Comb Loader Installation document P/N 02-107281-01 or 02-107281-02 for more details
on the Comb Loader installation and configuring your V2002 spinstand for operation with the new loading
mechanism.
Ping Pong Cartridge Design for Guzik 1701A+ Spinstands
The WITE32 software version 3.11 supports a Ping Pong cartridge designed for HLM-2F Head Loading Mechanism
of Guzik 1701A+ Guzik Spinstands. The Ping Pong cartridge was initially designed for the Head Loading
Mechanism HLM-3F on 1701B Guzik Spinstands.
The Ping Pong cartridges have a special design, which allows to use the head mounted on the top cartridge with the
bottom amplifier, or the head mounted on the bottom cartridge with the top amplifier.
Guzik Technical Enterprises
3
WITE32 Release Notes Version 3.11
1.4
Micro Actuator Support for Guzik V2002 Spinstands
A Micro Actuator is a device located on the suspension of a magnetic head that can transform applied voltage to the
radial displacement of the head. Micro Actuator testing is supported on Guzik V2002 Spinstands starting from
WITE32 version 3.11.
The Micro Actuator configuration and operation is described in the Micro Actuator Tests User's Guide P/N 02-
107264-02. Please also refer to section 2.3.2.4 on page 17 of this document for additional details on Micro Actuator
configuration.
1.4.1 Hardware Compatibility
Your test system hardware must be compatible with Micro Actuator in order to run Micro Actuator tests. A new
Micro Actuator item is added to the Info | Hardware Features dialog box. If the Micro Actuator item is marked with
the green check box, it means that all the required hardware and cables are installed and compatible with Micro
Actuator. The list in the round brackets shows whether CW, CCW, or both Head Amplifiers are compatible with
Micro Actuator.
Figure 1
Hardware Features Dialog Box
For upgrade pricing, please contact [email protected] and provide them your RWA and Spinstand EEPROM Dump
information if your test system requires an upgrade.
1.4.2 Micro Actuator Tests
There are two Micro Actuator tests available in WITE32 version 3.11:
•
•
Micro Actuator Stroke test
Micro Actuator Frequency Response test
Please refer to the Micro Actuator Tests User's Guide P/N 02-107264-02 for the description of the tests. These tests
are included into the Spinstand 2002 Tests module. The module is provided on the WITE32 Installation CD, however
the Micro Actuator tests require a license. Please contact [email protected] to obtain a quotation for Micro Actuator
tests license.
Guzik Technical Enterprises
4
WITE32 Release Notes Version 3.11
1.5
Head Amplifiers
The following head amplifiers are initially supported in WITE32 version 3.11:
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
81G214M
81G5114D
81G5114P
GTEMR4PP
MINI
MR5M_M
MUX_SR1795BAA
PA7500
PA7501
PA7515
SR1671
SR1850B
SR1852
SR1880
TLS26A954AA
TLS26D714
WABASH3x2
1.6
Head Stacks
The following head stacks are initially supported in WITE32 version 3.11:
•
•
•
•
•
81G214M – MAGELLAN_81G214M
PA7540B – NOVA_PA7540B
SR1641 – SCORPIO_1641
SR1784 – NOVA_SR1784
WABASH3 – WABASH3
1.7
Support of Head Amplifier Multiplexer
WITE32 software version 3.11 supports the Head Amplifier Multiplexer P/N S23-318690-01.
Guzik Technical Enterprises
5
WITE32 Release Notes Version 3.11
CHAPTER 2
WITE32 MODIFICATIONS
2.1
New System Erase and System Band Erase Configuration
Two new system configuration sets are introduced in WITE32: System Erase and System Band Erase. All tests and
operations, which invoke erase operation or band erase operation, use the System Erase and System Band Erase
settings or allow you to specify custom parameters for erase or band erase. This modification has two purposes:
1. The AC erase operation must be invoked in all tests and operations for perpendicular magnetic recording. In
earlier versions of WITE32, except for some special requirement of a test, an erase operation or a band erase
operation means that a positive direction DC erase operation is done with the existing write current. The
new system options make the erase operation configurable.
2. You can configure erase parameters in one dialog box and use this one common set of parameters in all tests
and operations, rather than configuring many tests separately. This simplifies WITE32 product maintenance
when you need to change one of the erase parameters, for example, the erase current. Starting from WITE32
version 3.11 it can be done in a common place – System Erase and System Band Erase dialog box.
The System Erase configuration is for erase operation performed on a single track, while System Band Erase is for
erase operation performed on a band of tracks. A new Control | Band Erase menu item is added to WITE32, which
includes both System Erase and System Band Erase configurations. When you click the Band Erase item on the
Control pull-down menu of WITE32 Engineering Dashboard, the following dialog box is displayed:
Figure 2
New System Band Erase Dialog Box
Guzik Technical Enterprises
6
WITE32 Release Notes Version 3.11
There are two frames in the dialog box – the Erase Parameters frame and the Band Erase Parameters frame.
The Erase Parameters frame allows you to define the erase configuration.
The Iterations text box
Defines the number of repetitions for each erase operation at each
offset
The Mode option buttons
Defines the erase modes:
•
•
•
Positive DC – the DC erase operation using the positive write
current for one revolution.
Negative DC – the DC erase operation using the negative
write current for one revolution.
Positive DC / Negative DC – the DC erase operation using
the positive write current for the first revolution, followed by
the DC erase operation using the negative write current for
the second revolution.
•
•
Negative DC / Positive DC – the DC erase operation using
the negative write current for the first revolution, followed by
the DC erase operation using the positive write current for
the second revolution.
AC – the AC erase operation for one revolution with the
frequency defined in the Frequency text box.
The Frequency text box
Defines the frequency for the AC erase operation, in MFlux/s.
The Write Current text boxes Define the write current values (in mA) used in the erase operation.
You can configure individual write current for the first and the second
revolution.
The Use System check boxes If the check box is checked, the Write Current text box value for the
corresponding revolution is ignored. The current system write current
is used instead.
The Band Erase Parameters frame allows you to define the area around the current track for the band erase operation.
The From text box
The To text box
The Step text box
Defines the starting offset position for the band erase operation,
in µInch.
Defines the ending offset position for the band erase operation,
in µInch.
Defines the offset step size for each erase operation, in µInch.
The Interleave Band Erase
If it is checked, the Mode option is ignored. The band erase operation
check box
is done in the following way:
1. Erase using the positive write current at the first offset
position.
2. Erase using the negative write current at the second
offset position.
3. Erase using the positive write current at the third offset
position, etc.
Note:
The band erase area is specified in terms of the head writer offset (in µInch) in respect to the center of the track.
All System Erase and System Band Erase parameters are zone/setup dependent, you can double-click on the
parameter label to specify the value of the parameter for each zone and setup.
Guzik Technical Enterprises
7
WITE32 Release Notes Version 3.11
CAUTION: When you upgrade tos WITE32 version 3.11 from the previous versions of WITE32, the product update
procedure performs the conversion of the old band erase configuration (specified in terms of number of
tracks to erase) to the new band erase configuration (specified in terms of From, To, and Step values).
This conversion uses the track size value specified in the Product Parameters dialog box for the selected
spinstand driver. Please make sure that you use proper spinstand driver and correct track size before you
update your product to WITE32 version 3.11.
2.1.1 Using System Erase In WITE32 Tests
All Guzik tests have been modified to use the system erase or system band erase configuration. An erase (or band
erase) operation by a test is done in one of the following ways:
1. If a test does not have its own erase (or band erase) operation configuration, the system erase (or band erase)
configuration settings will be used to erase the media.
2. If a test has its own configuration, it can be configured to either use system erase (or band erase) operation
setup, or to override the system erase (or band erase) operation setup with the custom settings.
2.1.2 Tests Without Erase Configuration
The following tests perform erase operation and were hard coded to erase the media using a Positive DC mode in
earlier WITE32 versions:
•
•
•
•
•
MR Tests module: Write-Impedance and Head Polarity tests.
Parametric Tests module: Parametric, PWN Stability, Overwrite, and Amplitude Stability tests.
PRML Tests module: Guzik Channel Optimization test.
Composite Tests module: Frequency, Triple-Track, and Saturation tests.
WITE Control module: Servo Calibration operation.
Starting from WITE32 version 3.11 these tests use System Erase configuration.
2.1.3 Tests With Erase Configuration
The following tests perform an erase operation and had their custom erase configurations in earlier WITE32 versions:
•
•
•
747 Tests module: 747 Comparator test.
Digital Parametric Tests module: Digital Parametric test.
Parametric Tests module: SNR and Spectral SNR tests.
Starting from WITE32 version 3.11 these tests are modified to either use System Erase configuration, or use custom
erase settings. Their original erase operation configurations are converted to the new format of the custom erase
settings.
Guzik Technical Enterprises
8
WITE32 Release Notes Version 3.11
The following is the SNR test configuration dialog box in WITE32 version 3.10 (provided as an example):
Original erase
operation
parameters
Figure 3
SNR Test Configuration in WITE32 version 3.10
The following is the new SNR test configuration dialog box in WITE32 version 3.11:
A new button opens a
configuration dialog box
for erase operation
Figure 4
SNR Test Configuration in WITE32 version 3.11
Guzik Technical Enterprises
9
WITE32 Release Notes Version 3.11
The new Erase Setup button is added to the configuration dialog box of the test. When it is clicked, an Erase
configure dialog box will open:
The caption shows which test erase
operation configuration is being edited
Selects between using a System Erase
configuration or Custom Erase configuration
Figure 5
SNR Test Erase Configuration in WITE32 version 3.11
2.1.4 Tests With Band Erase Configuration
The following tests perform a band erase operation and had their custom band erase configurations in earlier WITE32
versions:
Some test configurations have been modified to use System Band Erase. Their original band erase operation
configurations are converted to the new format:
•
•
Error Tests module: Popcorn test.
GMA Tests module: Low Erase Current, Single Track Critical Erase Current, Multi-Track Critical Erase
Current, Missing Pulse Avalanche, Extra Pulse Avalanche, and Undershoot Avalanche tests.
•
•
Parametric Tests module: Spectral Integral SNR test.
Erase and Band Erase operations of the production test.
Starting from WITE32 version 3.11 these tests are modified to either use System Band Erase, or use custom band
erase settings. Their original band erase configurations are converted to the new format.
Guzik Technical Enterprises
10
WITE32 Release Notes Version 3.11
The following is the Low Erase Current test configuration dialog box in WITE32 version 3.10:
Original erase
operation parameters
Original band erase
operation parameters
Figure 6
Low Erase Current Test Configuration in WITE32 version 3.10
The following is the new configuration dialog box in WITE32 version 3.11:
A new button
opens erase
configuration
dialog box
Figure 7
Low Erase Current Test Configuration in WITE32 version 3.11
Guzik Technical Enterprises
11
WITE32 Release Notes Version 3.11
The following is an example of the Band Erase dialog box, which opens after you press the Erase Setup… button in
the test configuration dialog box:
The caption shows which test erase
operation configuration is being edited
Selects between using a System Erase
configuration or Custom Erase configuration
Figure 8
Low Erase Current Test Band Erase Configuration in WITE32 version 3.11
2.1.5 Tests With Erase Preconditioning
A new System Erase option is added to preconditioning selection of WITE32 tests. When this option is selected, the
System Erase configuration will be used for preconditioning. The following is the list of the tests, which include this
new preconditioning option:
•
•
•
•
•
•
Digital Parametric Tests module: Digital Parametric test.
Error Tests module: Comparator Error test.
MR Tests module: Pulse Stability, Pulse Width Asymmetry, and TAA Asymmetry tests.
Parametric Tests module: Asymmetry, TAA, and Pulse Width tests.
PRML Tests module: Sequenced Amplitude Margin and Sampled Value Distribution tests.
Composite Tests module: Triple Track Profile and Pulse Profile tests.
Guzik Technical Enterprises
12
WITE32 Release Notes Version 3.11
2.2
2.3
New Adjacent Track Interference Module (WATI)
The new Adjacent Track Interference module (WATI module) is added to WITE32 package. This module contains
one test – the Adjacent Track Interference test. Please refer to the WATI Module Users Guide (P/N 02-107268-02)
for the description of the WATI module and the test. The WATI module requires a license and possible hardware
upgrade; please contact [email protected] and provide them your RWA and Spinstand EEPROM Dump information
to determine whether your test system requires an upgrade, and to request a quote for the license.
Spinstands and Servo
2.3.1 New Servo Control Dialog Box
The new Servo Control dialog box is added in WITE32 rev 3.11. It can be opened by selecting the Control | Servo…
menu item in the WITE32 Engineering Mode Dashboard.
Figure 9
New Servo Control Dialog Box
This dialog box has two check box controls:
1. Disable Servo Control if Loop is Unstable. If this check box is enabled, WITE32 turns off the servo control
in case the signal from the head becomes unstable. The warning message “Servo control is turned off. Check
that the signal from the head is stable” is displayed once, and the servo control is turned off. If this check
box is disabled, WITE32 will keep the servo control enabled regardless of the quality of the signal from the
head. This may result in the recurring error messages during head positioning, however, the system will try
to control the head position using servo whenever it is possible. It is recommended to enable this option in
the production environment, such that testing the heads producing poor signal can be finished in non-servo
mode. This control is available only for Guzik V2002 spinstands. For all other spinstands this check box is
disabled.
2. MA Enable – This control is reserved for future use with Micro Actuator.
2.3.2 V2002 Product Parameters Dialog Box Modifications
The Product Parameters dialog box contains the parameters of the Head and the Media under test. For V2002
spinstand, you can open the Product Parameters dialog box by selecting the Configure | Device… menu item in the
WITE32 Engineering Mode Dashboard, pressing the Run Alignment Program button in the Device Configure dialog
box, and pressing the Edit Product Parameters… button on the Equipment tab of the WDCP2002 program.
The layout of the Product Parameters dialog box for V2002 spinstand is changed and new parameters are added in
WITE32 version 3.11.
Guzik Technical Enterprises
13
|